• Home

  • Introduction

    • To Authors
    • Peer Review Process
    • Advertising Policy
    • Aims and Scope
  • Editorial Committee

  • Current Issue

  • Policy

    • Ethical Guidelines
    • Plagiarism Policy
  • Contact Us

  • Chinese

Author Login

Please enter the username and password on the right to complete the login.

E-mail login
Mobile login
  • E-mail
  • Password
  • Verification code
Remember me Privacy Policy Forgotten your password?
  • Phone number
  • Verification code
  • Dynamic password
    Send
Forgotten your password?
If this is your first visit click here:Register
You are the first     visitors
Superintended by:China Association for Science and Technology
Sponsored by:Chinese Institute of Electronics
Address:No. 79, Beiheyan Street, Dongcheng District, Beijing, China
Tel:010-64004400
Journal of Electronic Measurement and Instrumentation ® 2025 All Rights Reserved