Zhu Aijun
1. School of Electronic Engineering and Automation, Guilin University of Electronic Technology, Guilin 541004, China; 2. Guangxi Key Laboratory of Automatic Detecting Technology and Instruments, Guilin 541004, ChinaChen Duanyong
1. School of Electronic Engineering and Automation, Guilin University of Electronic Technology, Guilin 541004, China; 2. Guangxi Key Laboratory of Automatic Detecting Technology and Instruments, Guilin 541004, ChinaXu Chuanpei
1. School of Electronic Engineering and Automation, Guilin University of Electronic Technology, Guilin 541004, China; 2. Guangxi Key Laboratory of Automatic Detecting Technology and Instruments, Guilin 541004, ChinaHu Cong
1. School of Electronic Engineering and Automation, Guilin University of Electronic Technology, Guilin 541004, China; 2. Guangxi Key Laboratory of Automatic Detecting Technology and Instruments, Guilin 541004, ChinaLi Zhi
1. School of Electronic Engineering and Automation, Guilin University of Electronic Technology, Guilin 541004, China; 2. Guangxi Key Laboratory of Automatic Detecting Technology and Instruments, Guilin 541004, China; 3. Guilin University of Aerospace Technology, Guilin 541004, China1. School of Electronic Engineering and Automation, Guilin University of Electronic Technology, Guilin 541004, China; 2. Guangxi Key Laboratory of Automatic Detecting Technology and Instruments, Guilin 541004, China; 3. Guilin University of Aerospace Technology, Guilin 541004, China
TN256; TP391.72
