Enhance prominent spectral component of test set by using KM algorithm
Author:
Affiliation:

1. College of Computer Science and Electronic Engineering, Hunan University, Changsha 410082, China; 2. Guangdong Power Grid Co., Ltd. Zhuhai Power Supply Bureau, Zhuhai 519000, China

Clc Number:

TP302

  • Article
  • | |
  • Metrics
  • |
  • Reference [17]
  • |
  • Related
  • | | |
  • Comments
    Abstract:

    In the field of integrated circuit testing, in order to improve the test data compression ratio and test generation, it is often necessary to do spectral analysis of the test set and test response and calculate their prominent spectral component. A method is proposed to enhance the prominent spectral component of test set by using KM (KuhnMunkras) algorithm. Based on the test set and its prominent spectral component, a bipartite graph and a weighting matrix are constructed. The problem of the enhancement of prominent spectral component is transformed into a bipartite graph matching problem, and then be solved by KM algorithm. After the order adjustment of test set according to the matching relationship, the correlation between prominent component and test set is increased, and the prominent spectral component is enhanced. In this paper, the experimental results about the test set of the ISCAS89 benchmark circuits show that the coefficient of the sorted test can increase by 19.05% on average, and the test set residue compression ratio basis on FDR (frequencydirected runlength) code can increase by 4.59% on average.

    Reference
    [1]MEHTA U S, DASGUPTA K S, EVASHRAYEE N J. Unlengthbased test data compression techniques: How far from entropy and power bounds a survey[J]. VLSI Design, 2010(1): 19.
    [2]TOUBA N A. Survey of test vector compression techniques[J]. Design & Test of Computers, 2006, 23(4): 294303.
    [3]HSIAO T C, SETH S C. an analysis of the use of walsh spectrum in compact testing [J]. IEEE Transactions on Computers, 1984, 100(10): 934937.
    [4]GIANI A, SHENG S, HSIAO M S. Efficient spectral techniques for sequential ATPG[C]. Design, Automation & Test in Europe, 2001:204208.
    [5]YOGI N, AGRAWAL V D. BIST/testdecompressor design using combinational test spectrum [C]. Proceedings of VLSI Design and Test Symposium, IEEE, 2009:443454.
    [6]YOGI N, AGRAWAL V D. Spectral RTL test generation for gate level stuckat faults [C]. 15th IEEE Asian Test Symposium, 2006: 8388.
    [7]KUANG J S, ZHANG L, ZHOU Y B. Improve the compression ratios for codebased test vector compressions by decomposing[C]. 20th IEEE European Test Symposium (ETS), 2015: 16.
    [8]YOGI N. Spectral methods for testing of digital circuits[D]. Montgomery: Auburn University,2009.
    [9]DAVID B H, ZHANG J X. Techniques for constructing biorthogonal bipartite graph filter banks[J]. IEEE Transactions on Signal Processing, 2015, 63(21):57725783.
    [10]TUFAN K. Revisiting KM algorithms: A linear programming approach[C]. IEEE International Conference on Fuzzy Systems, 2015:16.
    [11]程一飞, 詹文法. 长度折半的测试资源编码方法[J]. 电子测量与仪器学报, 2016, 30(3): 480486. CHENG Y F, ZHAN W F. Test resource encoding method based on length halving[J]. Journal of Electronic Measurement and Instrumentation, 2016, 30(3): 480486.
    [12]黄庆卿, 汤宝平, 邓蕾. 无线传感器网络子带能量自适应数据压缩方法[J]. 仪器仪表学报, 2014, 35(9): 19982003. HUANG Q Q, TANG B P, DENG L. Subband energy adaptive data compression method for wireless sensor networks[J]. Chinese Journal of Scientific Instrument, 2014, 35(9): 19982003.
    [13]张伟昆. 测试性分析与评估体系的研究[J]. 国外电子测量技术, 2015, 34(5): 3842. ZHANG W K. Research on testability analysis and evaluation system [J]. Foreign Electronic Measurement Technology, 2015, 34(5): 3842.
    [14]田芳宁. 逻辑分析仪自动测试系统设计与实现[J]. 电子测量技术, 2014, 37(3): 8688. TIAN F N. Design and realize of automatic test system of logic analyzer[J]. Electronic Measurement Technology, 2014, 37(3): 8688.
    [15]ANSHUMAN C,KRISHNENDU C.Frequencydirected runlength(FDR) codes with application to systemonachip test data compression[C]. Proceedings of the 19th IEEE VLSI Test Symposium, 2001: 4247.
    [16]ELMALEH A H. Test data compression for systemonachip using extended frequencydirected runlength code[J]. IET Computers & Digital Techniques, 2008(2): 155163.
    [17]XRYSOVALANTIS K, EMMANOUIL K, DIMITRIS N. Optimal selective huffman coding for test data compression[J]. IEEE Transactions on Computers, 2007, 56(8): 11461152.
    Related
    Cited by
    Comments
    Comments
    分享到微博
    Submit
Get Citation
Share
Article Metrics
  • Abstract:9046
  • PDF: 7480
  • HTML: 0
  • Cited by: 0
History
  • Online: July 20,2017
Article QR Code