A large-scale closed-loop integrated Hall current sensor is designed based on the 0. 18 μm CMOS technology. The on-chip high-sensitivity Hall device is used to measure the magnetic field generated by the detected current and linearly output Hall signal. After linear amplification, offset cancellation, and proportional integral ( PI) regulation, the Hall voltage is compared with the triangular carrier to generate a PWM signal for driving the full-bridge power amplifier. The output current from the power amplifier is then sent to the secondary winding of the magnetic ring to form a closed-loop secondary side compensation, so that the Hall device in the magnetic ring air gap is in a zero magnetic flux state, thereby improving the accuracy of high current detection. Simulation results show that the designed integrated Hall current sensor achieves a high measurement range of 30 kA, the high accuracy level of 1, the low power consumption of 1. 08 W, and the low chip area occupation of 0. 2 mm 2 .