冯强,刘彦麟,夏慧,伍剑波,赵焰峰,汤宏宇,何雨洁,廖江.一种发射率可矫正的红外热成像全局检测方法[J].电子测量与仪器学报,2024,38(7):123-130
一种发射率可矫正的红外热成像全局检测方法
Emissivity-correctable global detection method for infrared thermography
  
DOI:
中文关键词:  管道腐蚀  缺陷检测  红外热成像检测  发射率矫正
英文关键词:pipeline corrosion  defect detection  infrared thermal imaging detection  emissivity correction
基金项目:国家自然科学基金(62373265,92060114)项目、四川省区域创新合作(2024YFHZ0157)项目资助
作者单位
冯强 四川科特检测技术有限公司德阳618300 
刘彦麟 四川大学机械工程学院成都610065 
夏慧 四川大学机械工程学院成都610065 
伍剑波 四川大学机械工程学院成都610065 
赵焰峰 四川科特检测技术有限公司德阳618300 
汤宏宇 四川科特检测技术有限公司德阳618300 
何雨洁 四川科特检测技术有限公司德阳618300 
廖江 四川科特检测技术有限公司德阳618300 
AuthorInstitution
Feng Qiang Sichuan KETE Test Technology Co.,Ltd., Deyang 618300, China 
Liu Yanlin School of Mechanical Engineering, Sichuan University, Chengdu 610065, China 
Xia Hui School of Mechanical Engineering, Sichuan University, Chengdu 610065, China 
Wu Jianbo School of Mechanical Engineering, Sichuan University, Chengdu 610065, China 
Zhao Yanfeng Sichuan KETE Test Technology Co.,Ltd., Deyang 618300, China 
Tang Hongyu Sichuan KETE Test Technology Co.,Ltd., Deyang 618300, China 
He Yujie Sichuan KETE Test Technology Co.,Ltd., Deyang 618300, China 
Liao Jiang Sichuan KETE Test Technology Co.,Ltd., Deyang 618300, China 
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中文摘要:
      在无损检测领域中,红外热成像检测具有重要地位。在利用红外热成像技术检测缺陷的过程中,受加工工艺和周围环境的影响,待检测设备的表面粗糙度各有殊异,材料表面的发射率不均,导致温度采集误差较大。针对该问题,结合热辐射基本定律探究出一种发射率可矫正的红外热成像全局检测法,意在矫正材料的表面发射率,降低检测过程中可能出现的缺陷错检漏检等安全性问题的风险。其仿真和实验结果表明,一方面使用红外热成像法检测时,表面粗糙度不同会严重干扰检测的准确性,具体影响为粗糙度越大,检测出的辐射温度越高;另一方面使用分离温度法可以实现矫正物体表面由于粗糙度不同带来的发射率不同的影响,仿真和实验结果表明矫正准确度可达70%左右,最高可以达到75%以上。基于此矫正检测方法能够有效实现基于红外热成像技术的全局检测,减少发射率对红外热像仪检测精度的影响,提高检测精度,同时也可以极大程度上提高缺陷检测的效率。
英文摘要:
      In the field of NDT, infrared thermal imaging testing has an important place. In the use of infrared thermal imaging testing to detect defects in the process, by the processing technology and the influence of the surrounding environment, the surface roughness of the equipment to be detected are different, the emissivity of the surface of the material is not uniform, resulting in a large error in temperature acquisition. To address this problem, a global detection method for infrared thermography with correctable emissivity is explored in conjunction with the fundamental law of thermal radiation. The intention is to correct the surface emissivity of the material and to reduce the risk of safety issues such as misdetection and omission of defects that may occur during the inspection process. The simulation and experimental results show that: on the one hand, when using infrared thermography detection, the surface roughness is different and it will seriously interfere with the accuracy of the detection, the larger the roughness, the higher the detected radiation temperature; on the other hand, the use of the separation of temperature method can be achieved by correcting the surface of the object, which results from the roughness of the different emissivity that brought about by the different impact of the different simulation, experimental results show that the corrective accuracy of up to 70% or so, and can reach a maximum of more than 75%. Based on this corrective detection method, it can effectively achieve global detection based on infrared thermal imaging technology, reduce the impact of the emissivity on the detection accuracy of infrared thermal camera, improve the detection accuracy, and greatly improve the efficiency of defect detection.
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