| 颜奕,黄宇,陈鸣,王自鑫.基于电容阵列I-V测试仪的光伏STC曲线拟合研究[J].电子测量与仪器学报,2017,31(2):272-279 |
| 基于电容阵列I-V测试仪的光伏STC曲线拟合研究 |
| Research on photovoltaic STC curves fitting based on capacitors array I V tracer |
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| DOI：10.13382/j.jemi.2017.02.016 |
| 中文关键词: 光伏组件 STC曲线 曲线拟合 I V测试仪 电容阵列 |
| 英文关键词:photovoltaic module STC curve curve fitting I V tracer capacitors array |
| 基金项目:珠海市重点实验室项目(20167612042080001)、广东省公益研究与能力建设专项资金(2014A010104010)资助项目 |
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| Author | Institution |
| Yan Yi | School of physics, Sun YatSen University, Guangzhou 510275, China |
| Huang Yu | School of physics, Sun YatSen University, Guangzhou 510275, China |
| Chen Ming | School of physics, Sun YatSen University, Guangzhou 510275, China |
| Wang Zixin | School of electronic and information technology, Sun YatSen University, Guangzhou 510006, China |
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| 中文摘要: |
| 现有的光伏组件在标准条件(STC)下I V曲线的拟合算法存在计算过于复杂或准确度不足的问题。为提高曲线在偏离STC环境下的拟合准度，提出了一种依据太阳电池四参数结构，通过选取曲线最大功率点(MPP)附近6个点作为拟合点，计算组件I V数学模型从而实现曲线拟合的拟合算法。不同光伏组件的最优拟合点间隔不同，为提高拟合精度，进一步提出了自适应拟合点选取方法，同时设计了以电容阵列为负载的I V测试仪结构并研制了一套完整仪器。该测试仪可通过增加MPP附近数据点的密度，提升拟合点的选取精度。经过MATLAB仿真与实际验证表明，模型拟合算法的拟合结果在各种测试环境下的准确度均高于多项式拟合算法；所设计的I V测试仪性能优越，适用于工程测量之中。 |
| 英文摘要: |
| Existing fitting algorithms for photovoltaic (PV) module correction I V curve under standard condition suffer from several problems, such as over complicated calculation and lack of accuracy. To improve fitting accuracy under condition deviated from STC, a fitting algorithm based on solar cell four parameter model was proposed. The module’s I V mathematical model for curves fitting is calculated by the algorithm through selecting six points as fitting points near the maximum power point. A self adaption fitting point selection method also was presented for accuracy improvement because different PV modules have different optimal interval among fitting points. Moreover, a type of I V tracer employing capacitors array as load to increase number of data points near the MPP was developed to improve fitting point’s accuracy. Several MATLAB simulations and actual measurement were carried out, which show that the proposed algorithm fitting results were superior to that of polynomial fitting algorithm. And the designed I V tracer not only has excellent performance but is suitable for engineering surveying. |
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