| 邱世振,白靖文,张晋行,刘晓瑞.基于六轴机械臂驱动的微波球面扫描成像系统[J].电子测量与仪器学报,2023,37(4):98-106 |
| 基于六轴机械臂驱动的微波球面扫描成像系统 |
| Microwave spherical scanning imaging system based on 6-DOF manipulator |
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| DOI： |
| 中文关键词: 机械臂运动学 电磁辐射源定位检测(ESM) 最优控制 路径规划 微波成像 |
| 英文关键词:kinematics of manipulator emission source microscopy (ESM) optimal control path planning microwave microscopy |
| 基金项目:国家重点研发计划(2020YFB1313600)项目资助 |
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| 中文摘要: |
| 基于合成孔径成像原理的扫描成像技术(ESM)在电子设备电磁干扰(EMI)检测领域具有明显的技术优势与应用价值,
但是其在球面成像算法与系统设计方面仍需进一步的研究与完善。 针对以上需求,本文提出了球面扫描成像任务下的机械臂
系统设计方法与控制策略。 在系统模型上,对机械臂构型、球面扫描边界与检测天线姿态进行建模,探索在以上约束下的最优
球面孔径求解方法。 在控制策略上,设计实现基于关节角搜索的机械臂控制策略与微波成像聚焦算法。 以上模型、方法与策略
在仿真实验中实现平均关节变化角降幅 60. 21%,在由六轴机械臂与基准微波辐射源搭建的验证实验中实现自动聚焦与精确成
像(聚焦精度 0. 1 mm,成像精度不低于 3. 14 dBm),可望应用于电子系统的 EMI 检测定位。 |
| 英文摘要: |
| Emission source microscopy ( ESM) based on synthetic aperture imaging principle has obvious technical advantages and
application value in the field of electromagnetic interference (EMI) detection of electronic equipment, but it still needs further research
and improvement in spherical imaging algorithm and system design. In view of the above requirements, this paper proposes the design
method and control strategy of the manipulator system under the spherical scanning imaging task. On the system model, the manipulator
configuration, spherical scanning boundary and detection antenna attitude are modeled, and the optimal spherical aperture solution
method under the above constraints is explored. In terms of control strategy, manipulator control strategy based on joint angle search and
the microwave microscopic imaging focusing algorithm are designed and implemented. The above models, methods and strategies achieve
a 60. 21% reduction in the angle of the average joint change in the simulation experiment. In the verification experiment built by the sixaxis manipulator and the reference microwave radiation source, the automatic focusing and accurate imaging are realized ( the focusing
accuracy is 0. 1 mm, and the imaging accuracy is not less than 3. 14 dBm), which is expected to be applied to EMI detection and
positioning of electronic systems. |
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