郭利强,王克先,陈 宁,宗 浩.宽频段雷达天线罩电厚度反射测试探头设计[J].电子测量与仪器学报,2021,35(12):87-92
宽频段雷达天线罩电厚度反射测试探头设计
Design of electric thickness reflex test probe for wideband radar radome
  
DOI:
中文关键词:  天线罩  电厚度  反射测试  魔 T  测试探头
英文关键词:radome  electrical thickness  reflex test  magic-T  test probe
基金项目:国防技术基础科研项目(JSZL2018205C005)资助
作者单位
郭利强 1. 中国电子科技集团公司第四十一研究所 电子测试技术重点实验室,2. 中电科思仪科技股份有限公司 
王克先 3. 航空工业济南特种结构研究所 
陈 宁 3. 航空工业济南特种结构研究所 
宗 浩 2. 中电科思仪科技股份有限公司 
AuthorInstitution
Guo Liqiang 1. The 41st institute of CETC, Science and Technology on Electronic Test & Measurement Laboratory,2. Ceyear Technologies Co. , Ltd. 
Wang Kexian 3. The Research Institute for Special Structures of Aeronautical Composite AVIC, The Aeronautical Science Key Lab for High Performance Electromagnetic Windows 
Chen Ning 3. The Research Institute for Special Structures of Aeronautical Composite AVIC, The Aeronautical Science Key Lab for High Performance Electromagnetic Windows 
Zong Hao 2. Ceyear Technologies Co. , Ltd. 
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中文摘要:
      在雷达天线罩电厚度反射测试中,针对测试探头与被测天线罩的失配反射限制测量范围,以及传统校准方法只适用于 特定单一工作频率的问题,采用波导魔 T 和半星形截面的介质柱相结合,设计了一种消除波导探头与天线罩外壁失配影响的贴 合式探头,优化提升了测试信号相位与天线罩插入相位变化的映射线性度,无需校准即可实现宽频段测量。 在 X 波段方波导 8~12 GHz 全频段范围内,探头对测试端口失配抑制可达 30 dB。 利用该探头,可以方便地将反射测试信号转化为传输信号,而 且仅通过简单的相位比对,即可获取天线罩电厚度信息,并可以直接实现不同工作频率下的测试。
英文摘要:
      Aiming at the issues such as measurement ability limitation caused by the mismatch between the test probe and the radome under test, as well as the traditional calibration methods apply only for a particular single operating frequency, one kind of radome electrical thickness reflection test probe is proposed innovatively by use of magic-T and half-star cross section prism. By which, the mismatch suppression can be up to 30 dB within 8 ~ 12 GHz full frequency range of X band, and the linearity of the phase mapping between the test signal and insertion phase difference of radome is optimized, and with no calibration required. Using this probe, the reflection test signal can be easily converted into transmission signal, the thickness information of the radome can be obtained by simple phase comparison, and the probe can be used at different operating frequencies at same time.
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