电子测量与仪器学报

赵文超,刘祖深,许虎.基于DMRS联合频偏估计方法及应用*[J].电子测量与仪器学报,2021,35(11):170-176

基于DMRS联合频偏估计方法及应用*

Method and application of joint frequency offset estimation based on DMRS

DOI：

中文关键词: 5 G下行 DMRS 载波频偏 CP

英文关键词:5G downlink DMRS carrier frequency offset CP

基金项目:中国电科集团专项创新基金项目（41Q1346）资助

作者	单位
赵文超	中北大学太原030051
刘祖深	中电科思仪科技（安徽）有限公司蚌埠233010；电子测量仪器技术蚌埠市技术创新中心蚌埠233010
许虎	中电科思仪科技（安徽）有限公司蚌埠233010；电子测量仪器技术蚌埠市技术创新中心蚌埠233010

Author	Institution
Zhao Wenchao	North University of China, Taiyuan 030051, China
Liu Zushen	Ceyear Technologies Co., Ltd (Anhui) Co., Ltd, Bengbu 233010,China; Bengbu Technology Innovation Center on Electronic Measurement Instrumentation Technology, Bengbu 233010, China
Xu Hu	Ceyear Technologies Co., Ltd (Anhui) Co., Ltd, Bengbu 233010,China; Bengbu Technology Innovation Center on Electronic Measurement Instrumentation Technology, Bengbu 233010, China

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中文摘要:

针对5G下行系统中普遍存在的载波频率偏移现象,提出了一种基于DMRS改进联合频偏估计方法。首先在时域通过CP相关进行频偏粗估计,当频偏大于15 kHz时,进行频偏补偿;然后在频域,为了减少信道噪声和衰落的影响,将接收端提取的DMRS和本地生成原始DMRS进行相关计算,得到信道响应值,再利用一个时隙内两处OFDM符号的DMRS信道响应值进行频偏细估计。所提方法使得频偏在［-15 kHz,15 kHz］范围内有了更高的估计精度,提升了系统总体性能,已应用于5G多通道基站综测仪

英文摘要:

Aiming at the common carrier frequency offset phenomenon in 5G downlink systems, an improved joint frequency offset estimation method based on DMRS is proposed. Firstly, the frequency offset is roughly estimated by CP correlation in the time domain, and compensated when the frequency offset is greater than 15k Hz; Then in the frequency domain, in order to reduce the influence of channel noise and fading, the cross correlation between the DMRS extracted on the receiving end and the original DMRS generated locally are calculated to obtain the channel response value, and then uses the DMRS channel response values of two OFDM symbols in one slot are used for fine frequency offset estimation. The method proposed enables a higher estimation accuracy when the frequency offset is ［-15 kHz, 15 kHz］, and improves the overall performance of the system, it has been applied to a 5G multi channel base station comprehensive test instruments.

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