宋常亮,孙博,唐泽波,李豫,吴泽豫.基于失效物理的多模式耦合可靠性建模方法*[J].电子测量与仪器学报,2021,35(11):124-131
基于失效物理的多模式耦合可靠性建模方法*
Multi mode coupling reliability modeling method based on physics of failure
  
DOI:
中文关键词:  多模式耦合  Copula函数  可靠性建模  失效物理
英文关键词:multi mode coupling  Copula function  system reliability model  physics of failure
基金项目:国防基础科研计划(JSZL2018204B002)项目资助
作者单位
宋常亮 贵州航天电子科技有限公司贵阳550009 
孙博 北京航空航天大学可靠性工程研究所北京100191 
唐泽波 贵州航天电子科技有限公司贵阳550009 
李豫 北京航空航天大学可靠性工程研究所北京100191 
吴泽豫 北京航空航天大学可靠性工程研究所北京100191 
AuthorInstitution
ong Changliang Guizhou Aerospace Electronic Technology Co., Ltd., Guiyang 550009, China 
Sun Bo Institute of Reliability Engineering, Beihang University, Beijing 100191, China 
Tang Zebo Guizhou Aerospace Electronic Technology Co., Ltd., Guiyang 550009, China 
Li Yu Institute of Reliability Engineering, Beihang University, Beijing 100191, China 
Wu Zeyu Institute of Reliability Engineering, Beihang University, Beijing 100191, China 
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中文摘要:
      电子系统由于其功能结构复杂,且工作在多载荷耦合的复杂环境条件下,导致其失效模式较多。因此,电子系统的失效更多的是多个失效模式共同作用的结果。而目前关于电子系统多模式耦合条件下的可靠性建模方法较少。针对电子系统多模式耦合条件下的可靠性建模方法进行研究。首先,通过基于失效物理的可靠性仿真分析方法获取各个单一失效模式的寿命分布信息,进而利用Copula函数对多模式耦合下的系统建立可靠性模型,给出了可靠度计算方法。最后,以某型综合电子系统进行案例研究,说明提出的方法能够获取更为准确的系统可靠度计算结果,避免了过于保守的可靠性评估。
英文摘要:
      The failure modes of electronic systems are various due to the complex functional structure and operation under complex environmental conditions of multi load coupling. Therefore, the malfunction of the electronic system can be regarded as the result of the mutual combination of multiple failure modes. At present, there are few reliability modeling methods considering the multi mode coupling of electronic systems. This paper studies the reliability modeling method under the condition of multi mode coupling of the electronic system. First, each failure mode's life distribution information is obtained through the reliability simulation analysis method based on the physics of failure. Then the Copula function is utilized to establish the reliability model of the multi mode coupling system, and the reliability calculation method is given. Finally, a case study of a specific type of integrated electronic system shows that the method proposed in this paper can achieve more accurate calculation results of reliability, and avoid overly conservative in reliability assessment.
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