廉小亲,陈彦铭,刘 钰,黄 静,龚永罡,霍亮生.基于差分进化算法的 ICP-AES 谱线重叠干扰校正方法研究[J].电子测量与仪器学报,2020,34(11):72-83
基于差分进化算法的 ICP-AES 谱线重叠干扰校正方法研究
Research on corrections method of ICP-AES spectral overlap interference based on differential evolution algorithm
  
DOI:
中文关键词:  ICP-AES  谱线重叠  干扰校正  差分进化算法  有限差分法
英文关键词:ICP-AES  overlap spectral lines  interference correction  differential evolution algorithm  finite difference method
基金项目:国家自然科学基金(61807001)、北京工商大学研究生培养-研究生教育质量提升计划项目(19008020144)资助
作者单位
廉小亲 1. 北京工商大学 人工智能学院,2. 北京工商大学 中国轻工业工业 互联网与大数据重点实验室 
陈彦铭 1. 北京工商大学 人工智能学院,2. 北京工商大学 中国轻工业工业 互联网与大数据重点实验室 
刘 钰 1. 北京工商大学 人工智能学院,2. 北京工商大学 中国轻工业工业 互联网与大数据重点实验室 
黄 静 1. 北京工商大学 人工智能学院,2. 北京工商大学 中国轻工业工业 互联网与大数据重点实验室 
龚永罡 1. 北京工商大学 人工智能学院,2. 北京工商大学 中国轻工业工业 互联网与大数据重点实验室 
霍亮生 1. 北京工商大学 人工智能学院,2. 北京工商大学 中国轻工业工业 互联网与大数据重点实验室 
AuthorInstitution
Lian Xiaoqin 1. School of Artificial Intelligence, Beijing Technology and Business University, 2. China Light Industry Key Laboratory of Industrial Internet and Big Data, Beijing Technology and Business University 
Chen Yanming 1. School of Artificial Intelligence, Beijing Technology and Business University, 2. China Light Industry Key Laboratory of Industrial Internet and Big Data, Beijing Technology and Business University 
Liu Yu 1. School of Artificial Intelligence, Beijing Technology and Business University, 2. China Light Industry Key Laboratory of Industrial Internet and Big Data, Beijing Technology and Business University 
Huang Jing 1. School of Artificial Intelligence, Beijing Technology and Business University, 2. China Light Industry Key Laboratory of Industrial Internet and Big Data, Beijing Technology and Business University 
Gong Yonggang 1. School of Artificial Intelligence, Beijing Technology and Business University, 2. China Light Industry Key Laboratory of Industrial Internet and Big Data, Beijing Technology and Business University 
Huo Liangsheng 1. School of Artificial Intelligence, Beijing Technology and Business University, 2. China Light Industry Key Laboratory of Industrial Internet and Big Data, Beijing Technology and Business University 
摘要点击次数: 270
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中文摘要:
      在电感耦合等离子体原子发射光谱法(ICP-AES)测量系统中,光谱的叠加现象会导致大部分谱线受到不同程度的重叠 干扰,引起后续的定量分析误差。 根据光谱叠加产生机理,重点阐述谱线重叠干扰校正思路,建立干扰校正评价函数;基于有限 差分法计算重叠谱线的近似二阶导数,根据其极小值分布确定重叠谱线中子峰谱线特征波长的最小取值区间,并以此作为差分 进化算法的初始条件之一,然后利用差分进化算法求解评价函数的最优解,作为重叠谱线的最佳特征向量,进而解析出重叠谱 线中的干扰谱线和目标谱线。 通过构造的模拟重叠谱线数据,研究差分进化算法的种群数量和进化代数对算法性能的影响,并 通过实测重叠谱线数据验证了提出的谱线重叠干扰校正方法在工程领域中应用的可行性。 实验结果表明,差分进化算法能够 较为准确地计算出评价函数的最佳特征向量,并解析出重叠谱线中的目标谱线和干扰谱线,从而实现谱线重叠干扰校正,为待 测溶液中元素含量的定量分析奠定了基础。
英文摘要:
      In the ICP-AES measurement system, the phenomenon of spectral superposition causes most of the spectral lines to be interfered by different degrees of overlap, which results in subsequent quantitative analysis errors. In this paper, the method of spectral overlap interference correction is explained and the evaluation function is established according to the mechanism of spectral superposition; By using the finite difference method to calculate the approximate second derivative and the distribution of the minimum value of the approximate second derivative, the minimum range of the characteristic wavelength of the neutron peak in the overlap spectral lines can be determined, and use the range as one of the initial conditions of the differential evolution algorithm. Then use the differential evolution algorithm to get the optimal solution of the evaluation function as the optimal eigenvector of the overlap spectral lines. The interference spectral lines and target spectral lines in the overlap spectral lines are analyzed by the optimal eigenvector. The effect of parameters NP and G on the performance of the differential evolution algorithm is tested by simulated overlap spectral lines data, and the feasibility of the spectral line overlap correction method proposed in this paper in the field of engineering is verified by measured overlap spectral lines data. The experimental results show that the differential evolution algorithm can be used to calculate the optimal eigenvector of the overlap spectral lines, and parse out the target spectral lines and the interference lines in the overlap spectral lines, thereby achieving the overlap spectral line interference correction, which lays the foundation for the subsequent quantitative analysis of element content.
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