| 何怡刚,张学勤,姚 瑶,高 贺,汪志宁.基于图形法的超辐射发光二极管性能退化可靠性评估[J].电子测量与仪器学报,2020,34(9):77-84 |
| 基于图形法的超辐射发光二极管性能退化可靠性评估 |
| Reliability evaluation of performance degradation of superluminescent diode based on graphic method |
| |
| DOI： |
| 中文关键词: 超辐射发光二极管 可靠度 个体分布标识 对数正态分布 |
| 英文关键词:superluminescent diode reliability individual distribution identification lognormal distribution |
| 基金项目:国家自然科学基金(51977153,51577046)、国家自然科学基金重点项目(51637004)、国家重点研发计划“重大科学仪器设备开发”项目(2016YFF0102200)、装备预先研究重点项目(41402040301)资助 |
|
|
|
|
| 摘要点击次数: 860 |
| 全文下载次数: 2177 |
| 中文摘要: |
| 超辐射发光二极管(SLD)作为一个重要的特殊光源,针对 SLD 可靠度和寿命的预测精度要求高的问题,提出了基于图
形法的 SLD 性能退化可靠性评估方法。 首先采用加速应力的方式获得 SLD 的短时间内的无失效数据;其次根据退化轨迹采用
最小二乘法进行拟合得到适合于退化轨迹的曲线方程,并根据失效阈值计算出超辐射发光二极管的伪失效寿命;最后采用
Minitab 对伪失效寿命进行个体分布标识,选用接受度高的对数正态分布,得出常温下失效前的平均工作时间。 实验结果表明,
该方法可以精准预测 SLD 的可靠度和寿命,相对于其他方法其精度提高了 9. 09%。 |
| 英文摘要: |
| As an important special light source, superluminescent diode ( SLD) has been proposed to evaluate the reliability of SLD
performance degradation based on graphic methods in view of the high requirement of the reliability and lifetime prediction accuracy of
SLD. First, the accelerated stress method is used to obtain the short-term failure-free data of the SLD. Secondly, according to the
degradation trajectory, a curve equation suitable for the degradation trajectory is fitted by using the least square method, and the pseudo
failure life of the SLD is calculated according to the failure threshold. Finally, Minitab was used to identify the individual distribution of
the pseudo failure life, and a log-normal distribution with high acceptance was used to obtain the average working time before failure at
room temperature. Experimental results show that this method can accurately predict the reliability and life of SLD, and its accuracy is
improved by 9. 09% compared with other methods. |
| 查看全文 查看/发表评论 下载PDF阅读器 |
|
|
|
